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 | Next Generation Instrumentation
Faster, quieter and more channels for higher throughput
Advanced Phased Array, Full Matrix Capture and Wide Dynamic Range Ultrasound. Single pass inspection of highly attenuating materials and rapid scanning of large areas. | |
 | Data Acquisition for Flaw Detectors
Keep using the instruments you already own.
Now you can record RF waveforms or analog data using a wide range of digitizers. Captured signals can be used for analysis, reporting and inspection automation. | |
 | Integration of Other Techniques
Eddy Current, Laser and other cool stuff
Incorporate just about any inspection method into an automated system. New instruments supported in weeks. | |
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